The VIAVI MAP product family truly provides a comprehensive testing portfolio for a broad range of optical transmission network elements. Choose from a product family with a proven track record of superior equipment testing.
Singlemode Insertion Loss / Return Loss test meter and fully EF-compliant multimode Insertion Loss test modules for use with the VIAVI advanced MAP-Series platform.
Optical Switch Solutions built on the industry-leading, fourth-generation instrumentation class of VIAVI optical switch technology.
Test solution for manufacturing and new device development of passive DWDM devices, ROADMs & Circuit Packs. Provides full characterization of wavelength dependence performance.
MAP Series Tunable Distributed Bragg Reflector (DBR) laser (mTLG-C2) is a new-generation tunable laser that is ideal for DWDM testing where the capability to change wavelength on demand over the C- band with 50 GHz spacing is essential.
Optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements.
Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.
The MAP Broadband Light Source (mBBS-C1) provides an amplified spontaneous emission (ASE) output that is ultra-stable, spectrally flattened and high-power density across the extended C-band and L-band.
The MAP Series Erbium Doped Fiber Amplifiers (mEDFA-C1) meet some of the most demanding optical specifications including a low-noise version with <3.7dB noise figure. DWDM, high power and an L-band version are also available.
Panel mount or remote head configurations with densities up to 4 per module.
High-resolution, wide wavelength-range attenuator ideal for use in applications such as analog systems and high bit-rate digital systems.
The MAP-based integrated multi-wavelength meter and high resolution optical spectrum analyzer module combines sub-GHz resolution performance and compact modularity in a single slot cassette.
Integrated automated test facilities for testing long-term reliability of optical components while subjected to environmental stress conditions in a temperature/humidity chamber.
The Multiple Application Platform (MAP) multiport tunable filter module (mTFX-C1) dramatically simplifies test signal management for next-generation 100 G+ interfaces, sub-systems, and system test.
The MAP General Purpose Light Sources (mSRC-C2) are fiber-coupled, fixed-wavelength emitters that cover key Telecom/Datacom wavelength bands of 850, 1300, 1310, 1490, 1550, and 1625 nm.
The MAP Polarization Control Module (mPCX-C1) provides polarization scrambling, control and stabilization for use in applications such as temporal depolarization, 100G+ coherent interface testing as well as stabilization and tracking of target SOP conditions
The MAP Passive Utility Module, mUTL-C1, provides a range of passive optical devices such as couplers, splitters, Mux/Demux modules and band-pass filters to simplify the integration of these devices into automated test systems
The one tool data center operators need to remotely test transmission quality of the network connecting its data centers, central offices, or head ends.
Single-channel, polarization-independent semiconductor optical amplifier (SOA)
Third Generation optical test and measurement system that is optimized for compact cost-effective development and manufacturing of optical communications technology.